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Yield (metric)

In integrated circuit reliability engineering, yield is a metric used to quantify the proportion of manufactured chips that meet the required performance specifications despite variations in the semiconductor fabrication process. In modern semiconductor manufacturing, yield has a direct influence on the cost of chip products. As such, it is crucial for…

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Overview

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Formulation

Yield estimation

Yield optimization

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Map overview Semantic statistics

Yield (metric)

Nodes39
Edges38
Triples3
Avg. degree1.95
Density0.051282
Components1

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Important terminology Word statistics

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Important terminology

yield displaystyle circuit optimization mathbf design estimation specifications simulations performance variations process mathcal function distribution samples used required semiconductor parameters

Entity relationships Subject–Predicate–Object triples

SubjectPredicateObjectConfidenceSrc
doping fluctuationsinstance ofprocess variations0.80text
intra-die mismatchesinstance ofprocess variations0.80text
and threshold voltage variations have become increasingly significant in affecting circuit performanceinstance ofprocess variations0.80text

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