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Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the…
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tem electron sample electrons beam may diffraction image used specimen imaging lens contrast using microscope samples high also holders resolution
| Subject | Predicate | Object | Confidence | Src |
|---|---|---|---|---|
| Transmission electron microscopy | is a | major analytical method in the physical | 0.90 | text |
| a scintillator attached to a charge-coupled device or a direct electron detector.Transmission electron microscopes are capable of imaging at a significantly higher resolution than light microscopes | instance of | or a detector | 0.80 | text |
| owing to the smaller de Broglie wavelength of electrons | instance of | or a detector | 0.80 | text |
| paleontology | instance of | but also in other fields | 0.80 | text |
| palynology.TEM instruments have multiple operating modes including conventional imaging | instance of | but also in other fields | 0.80 | text |
| scanning TEM imaging | instance of | but also in other fields | 0.80 | text |
| photographic film | instance of | and an image recording system | 0.80 | text |
| doped YAG screen coupled CCDs | instance of | and an image recording system | 0.80 | text |
| or other digital detector | instance of | and an image recording system | 0.80 | text |
| specimen holders | instance of | TEM components | 0.80 | text |
| film cartridges must be routinely inserted or replaced requiring a system with the ability to re-evacuate on a regular basis | instance of | TEM components | 0.80 | text |
| a higher vacuum of 10 | instance of | Sections of the TEM may be isolated by the use of pressure-limiting apertures to allow for different vacuum levels in specific areas | 0.80 | text |
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