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Selected area diffraction

Selected area (electron) diffraction (abbreviated as SAD or SAED) is a crystallographic experimental technique typically performed using a transmission electron microscope (TEM). It is a specific case of electron diffraction used primarily in material science and solid state physics as one of the most common experimental techniques. Especially with…

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Selected area diffraction

Nodes65
Edges64
Triples5
Avg. degree1.97
Density0.030769
Components1

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diffraction beam electron sample sad used pattern crystal electrons area allows selected lattice crystallographic spots material analysis ring also diffracted

Entity relationships Subject–Predicate–Object triples

SubjectPredicateObjectConfidenceSrc
crystallites in polycrystalline material with a broad parallel beam.Character of the resulting diffraction image depends on whether the beam is diffracted by one single crystal or by number of differently oriented crystallites for instance in a polycrystalline materialinstance ofThis allows to study small objects0.80text
CrysTBox are capable of automated analysis achieving sub-pixel precision.If the sample is tilted against the electron beaminstance ofTools0.80text
diffraction conditions are satisfied for different set of crystallographic planes yielding different constellation of diffraction spotsinstance ofTools0.80text
stacking faults.Ring diffraction pattern.mw-parser-output .tmulti .multiimageinnerinstance ofA series of diffractograms varying in tilt can be acquired and processed with diffraction tomography analysis in order to reconstruct an unknown crystal structure.SAD can also b…0.80text
stacking faultsinstance ofA series of diffractograms varying in tilt can be acquired and processed with diffraction tomography analysis in order to reconstruct an unknown crystal structure.SAD can also b…0.80text

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