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Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry measures the change of polarization upon reflection or transmission and compares it to a model.
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optical spectroscopic sample thickness properties light technique polarization used isbn reflection parameters displaystyle complex film thin material wavelength samples matrix
| Subject | Predicate | Object | Confidence | Src |
|---|---|---|---|---|
| Ellipsometry | is a | optical technique for investigating the dielectric properties | 0.90 | text |
| Ellipsometry | is a | specular optical technique | 0.90 | text |
| Ellipsometry | is a | very sensitive measurement technique and provides unequaled capabilities for thin film metrology | 0.90 | text |
| biology | instance of | Ellipsometry is also becoming more interesting to researchers in other disciplines | 0.80 | text |
| medicine | instance of | Ellipsometry is also becoming more interesting to researchers in other disciplines | 0.80 | text |
| molecular adsorption or film growth | instance of | and dynamic processes | 0.80 | text |
| TEM | instance of | and it is possible to extract the n and k values by measuring the thickness of the sample using another technique | 0.80 | text |
| Ellipsometry | has application | This | 0.60 | section |
| Ellipsometry | has application | As | 0.60 | section |
| Ellipsometry | has application | Because | 0.60 | section |
| Ellipsometry | related to Advantages | If | 0.60 | section |
| Ellipsometry | related to Advantages | Therefore | 0.60 | section |
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