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Secondary-ion mass spectrometry: History & Applications

Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. The mass/charge ratios of these secondary ions are measured with a mass spectrometer to determine the…

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Secondary-ion mass spectrometry topic overview

The analysis highlights History and Applications as prominent areas in the source structure around Secondary-ion mass spectrometry.

Related topics: 65
Source areas: 6
Connected nodes: 71
Extracted relationships: 21
Concept neighborhoods: 21
Bridge connections: 71

What this topic covers Research coverage

Source areas are shown by the number of related topics found in each part of the analysis. Use smaller areas too: they can reveal specialized angles and content gaps.

Instrumentation · 27 topics

History · 23 topics

Static and dynamic modes · 5 topics

Overview · 4 topics

Applications · 3 topics

Detection limits and sample degradation · 3 topics

Smaller areas are not necessarily less important. They contain fewer connections in this analysis and can be useful for finding specialized angles or coverage gaps.

Key facts & relationships

High-confidence facts extracted from structured source data. Use them as anchors for further research.

Acronym: SIMS
Analytes: Solid surfaces, thin films
Classification: Mass spectrometry
Related: Fast atom bombardment Microprobe

Suggested research paths

A focused starting point derived from the topic graph, ranked independently of the source article order.

Start with these areas

Explore all related topics Closing gaps

Browse the complete topic structure, not only the most central items. Less prominent entities and concepts can reveal missing angles, specialized context and useful research gaps. Each item opens a new analysis centered on that subject.

Overview

Thin films Thin film
Sputtering
Ion beam
Mass spectrometer Mass spectrometry

History

J. J. Thomson
Vacuum pump
University of Vienna
RCA Laboratories
Princeton, New Jersey
NASA
Moon rocks Moon rock
University of Paris-Sud in Orsay Paris-Sud 11 University
Sector instrument
Argon
Quadrupole mass analyzers Quadrupole mass analyzer
Static SIMS Static secondary-ion mass spectrometry
Time-of-flight mass spectrometers Time-of-flight mass spectrometry
University of Münster
Germany
CAMECA S.A.S. Cameca
Materials science
Surface science
C60+ Buckminsterfullerene
Gold
Bismuth
Sensitive high-resolution ion microprobe
Canberra, Australia

Instrumentation

Ion guns Ion gun
Wien filter
High vacuum Vacuum
Pa Pascal (unit)
Mbar Bar (unit)
Torr
Mean free path
Adsorption
Duoplasmatrons Duoplasmatron
Electron ionization
Noble gases Noble gas
Xe Xenon
Oxygen
SF6 Sulfur hexafluoride
Fullerene
Surface ionization
Caesium
Tungsten
Liquid metal ion gun Liquid metal ion source
Gallium
Indium
Melting points Melting point
Electropositive Electronegativity
Faraday cup
Electron multiplier
Microchannel plate detector
Fluorescent Fluorescence

Detection limits and sample degradation

Detection limits Detection limit
Cubic centimetre
Microfossils Microfossil

Static and dynamic modes

Applications

Advanced semantic analysis

Deeper signals for content research, entity SEO and topical coverage. The plain-language headings explain what each technical view is useful for.

How Secondary-ion mass spectrometry connects Entity context

The extracted context around Secondary-ion mass spectrometry shows recurring relationship patterns in the source. For example, Secondary-ion mass spectrometry → DC, DSIMS, Dynamic, Fenn, In, John, Koichi Tanaka, SIMS, Static SIMS Another extracted example is Secondary-ion mass spectrometry → Churyumov, Gerasimenko, More, NanoSIMS, Rosetta, SIMS, The COSIMA. Use these groups to spot repeated connection types before inspecting the individual relationships.

Secondary-ion mass spectrometry

Top relations

related to Static and dynamic modes · 9

Secondary-ion mass spectrometry → DC, DSIMS, Dynamic, Fenn, In, John, Koichi Tanaka, SIMS, Static SIMS

has application · 7

Secondary-ion mass spectrometry → Churyumov, Gerasimenko, More, NanoSIMS, Rosetta, SIMS, The COSIMA

Acronym · 1

Secondary-ion mass spectrometry → SIMS

Analytes · 1

Secondary-ion mass spectrometry → Solid surfaces, thin films

Classification · 1

Secondary-ion mass spectrometry → Mass spectrometry

Related · 1

Secondary-ion mass spectrometry → Fast atom bombardment Microprobe

Important terminology

Use these terms to understand the vocabulary surrounding the topic, not as a checklist for keyword stuffing.

Important terminology

sims ion mass ions surface primary used secondary secondary-ion beam static type pulsed gun analysis spectrometry composition elemental analyzer sector

Secondary-ion mass spectrometry relationships Subject–Predicate–Object triples

TTTA extracted 21 structured relationships around Secondary-ion mass spectrometry. Examples in this analysis include Secondary-ion mass spectrometry → Acronym → SIMS and Secondary-ion mass spectrometry → Analytes → Solid surfaces, thin films. The table shows each extracted connection, where it came from and its confidence.

Subject	Predicate	Object	Confidence	Src
Secondary-ion mass spectrometry	Acronym	SIMS	1.00	infobox
Secondary-ion mass spectrometry	Analytes	Solid surfaces, thin films	1.00	infobox
Secondary-ion mass spectrometry	Classification	Mass spectrometry	1.00	infobox
Secondary-ion mass spectrometry	Related	Fast atom bombardment Microprobe	1.00	infobox
SF5	instance of	or even ionized molecules	0.80	text
Secondary-ion mass spectrometry	has application	The COSIMA	0.60	section
Secondary-ion mass spectrometry	has application	Rosetta	0.60	section
Secondary-ion mass spectrometry	has application	Churyumov	0.60	section
Secondary-ion mass spectrometry	has application	Gerasimenko	0.60	section
Secondary-ion mass spectrometry	has application	SIMS	0.60	section
Secondary-ion mass spectrometry	has application	More	0.60	section
Secondary-ion mass spectrometry	has application	NanoSIMS	0.60	section

Related concept clusters Concept neighborhoods

The concept neighborhoods around Secondary-ion mass spectrometry bring nearby vocabulary together. In this analysis, examples include Spectrometry, Composition and Spectrometer. Use the clusters to find adjacent concepts and terminology that may deserve separate research.

Secondary-ion mass spectrometry
- Spectrometry
- Composition
- Spectrometer
- Secondary-ion
- Magnetic
- Primary
- Surfaces
- Ion
- Dynamic
- Instruments
- Sample
- Detector
secondary-ion mass spectrometry
- Surfaces
- Spectrometry
- Cameca
- Composition
- Solid
- Spectrometer
- Analyzer
- Sector
- Ions
- Dynamic
- Secondary-ion
- Magnetic
ion beam
- Primary
- Pulsed
- Beam
- Ion
- Gun
- Sputtering
- Secondary-ion
- Surface
- Sample
- Current
- Spectrometer
- Sector
mass spectrometer
- Sector
- Magnetic
- Spectrometer
- Spectrometry
- Analyzer
- Ions
- Secondary-ion
- Field
- Composition
- Instruments
- Primary
- Sims
quadrupole mass analyzers
- Spectrometer
- Spectrometry
- Analyzer
- Sector
- Ions
- Secondary-ion
- Magnetic
- Composition
- Instruments
- Primary
- Sims
- Surfaces
static sims
- Dynamic
- Static
- Analysis
- Magnetic
- Sector
- Surface
- Instruments
- Pulsed
- Used
- Technique
- Vacuum
- Spectrometry
time-of-flight mass spectrometers
- Spectrometer
- Spectrometry
- Analyzer
- Sector
- Ions
- Secondary-ion
- Magnetic
- Composition
- Instruments
- Primary
- Sims
- Surfaces
sensitive high-resolution ion microprobe
- Primary
- Beam
- Pulsed
- Gun
- Secondary-ion
- Surface
- Current
- Static
- Type
- Sims
- Mass
- Sample

Connections between topic areas Semantic bridges

For Secondary-ion mass spectrometry, one of the stronger structural bridges in this analysis connects Secondary-ion mass spectrometry with Instrumentation. Bridges highlight paths between different parts of the map and can reveal research angles that are easy to miss in a flat list.

Min side: 3

Secondary-ion mass spectrometry — Instrumentation · splits 44 ⟂ 28

Secondary-ion mass spectrometry — History · splits 48 ⟂ 24

Secondary-ion mass spectrometry — Static and dynamic modes · splits 66 ⟂ 6

Secondary-ion mass spectrometry — Overview · splits 67 ⟂ 5

Secondary-ion mass spectrometry — Detection limits and sample degradation · splits 68 ⟂ 4

Secondary-ion mass spectrometry — Applications · splits 68 ⟂ 4

Map overview Semantic statistics

Secondary-ion mass spectrometry

Nodes72

Edges71

Triples21

Avg. degree1.97

Density0.027778

Components1

Source & methodology

TTTA analyzes the structure around Secondary-ion mass spectrometry to surface related topics, entities, relationships, concept neighborhoods and bridge connections. Use the map to explore areas such as History & Applications, including less central topics that may reveal useful research gaps. Automatically extracted connections are research leads rather than rewritten encyclopedia content.

Source: Wikipedia — Secondary-ion mass spectrometry · EN edition · Analysis: TopicsToTalkAbout

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