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Reliability of a semiconductor device is the ability of the device to perform its intended function during the life of the device in the field.
Measurement, Failure mechanisms & Overview
Explore the main themes, entities and connections around Reliability (semiconductor). Start with the topic map, then use the sections below for research and deeper semantic analysis.
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semiconductor reliability devices failure design mechanisms temperature stress process device impurities materials many current testing thermal high control include methods
| Subject | Predicate | Object | Confidence | Src |
|---|---|---|---|---|
| in military or aerospace applications | instance of | Non destructive tests are normally used when extreme reliability is required | 0.80 | text |
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