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Electromigration

Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms. The effect is important in applications where high direct current densities are used, such as in microelectronics and related structures. As the structure size in…

History & Standards

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Overview

History

Practical implications of electromigration

Fundamentals

Failure mechanisms

Electromigration-aware design

Electromigrated nanogaps

Reference standards

Books

  • ISBN ISBN (identifier)
  • Doi Doi (identifier)

Advanced semantic analysis

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Map overview Semantic statistics

Electromigration

Nodes99
Edges98
Triples130
Avg. degree1.98
Density0.020202
Components1

How this topic connects Entity context

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Electromigration

Top relations

related to External links · 14
Electromigration → An Introduction, ComModeling, Computer Simulation Laboratory, Designers, DWPG, EETimes, Learning Package, Lloyd, Middle East Technical University, Non-Specialist, Semiconductor, Teaching, UniPro, What
related to history · 12
Electromigration → At, Black's, Blech, Currently, French, Gerardin, ICs, Jim Black, Motorola, One, Research, The
related to Electromigration in solder joints · 11
Electromigration → A/cm2, Al, Cu, Due, For, IC, It, SnAgCu, SnPb, The, Then
related to Books · 10
Electromigration → Christou, CS1, Electromigration-Aware Integrated Circuit Design, Electronic Device Degradation, Fundamentals, ISBN, Lienig, Springer, Thiele, Wiley
related to Electromigration reliability of a wire (Black's equation) · 10
Electromigration → At, Black, Black's, Boltzmann, For, Here, However, MTTF, Since, The
related to Reference standards · 9
Electromigration → Chapter, EIA/JEDEC Standard EIA/JESD61, EIA/JEDEC Standard EIA/JESD63, Electromigration-Aware Integrated Circuit Design, Fundamentals, In, Isothermal Electromigration Test Procedure, Springer, Standard
related to Healing · 8
Electromigration → AC, Although, DC, Even, Further, In, It, This
related to Practical implications of electromigration · 8
Electromigration → Black's, Due, HTOL, ICs, It, Reliability, The, To
related to Bamboo structure and metal slotting · 7
Electromigration → Also, Here, However, In, The, This, With
related to Blech length · 7
Electromigration → Any, Blech, Here, It, The Blech, There, This

Important terminology Word statistics

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Important terminology

current atoms interconnect failure displaystyle metal due conductor density also interconnects wire diffusion copper length material structure grain aluminium electrons

Entity relationships Subject–Predicate–Object triples

SubjectPredicateObjectConfidenceSrc
Electromigrationis atransport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms0.90text
integrated circuitsinstance ofAs the structure size in electronics0.80text
low voltage power MOSFETsinstance ofbut not before significant damage was done to the company's reputation.Electromigration can be a cause of degradation in some power semiconductor devices0.80text
in which the lateral current through the source contact metallisationinstance ofbut not before significant damage was done to the company's reputation.Electromigration can be a cause of degradation in some power semiconductor devices0.80text
Electromigrationhas effectIn0.60section
Electromigrationhas effectNormally0.60section
Electromigrationhas effectHowever0.60section
Electromigrationhas effectVLSI0.60section
Electromigrationhas effectHigh0.60section
Electromigrationrelated to Bamboo structure and metal slottingAlso0.60section
Electromigrationrelated to Bamboo structure and metal slottingHowever0.60section
Electromigrationrelated to Bamboo structure and metal slottingThe0.60section

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    Min side: 3
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