Automatic test pattern generation

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Algorithmic methods

Very-large-scale integrated Sequential Boolean difference Literal proposition Algorithm

11 related topics

Sequential ATPG

Test vectors Space of all possible test vector sequences Controllability Observability Sequential circuit

8 related topics

Basics

Device under test NP-complete Boolean satisfiability problem P≠NP

4 related topics

Overview

Electronic design automation Digital circuit Automatic test equipment Failure analysis Fault models

9 related topics

Topics to explore

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Overview

Basics

Sequential ATPG

Test vectors Test vector
Space of all possible test vector sequences State space
Controllability
Observability
Sequential circuit
Combinational logic
Design For Testability Design For Test
Partial scan

Algorithmic methods

Very-large-scale integrated Very-large-scale integration
Sequential Sequential logic
Boolean difference
Literal proposition Literal proposition?action=edit&redlink=1
Algorithm
Prabhu Goel
FAN algorithm
Boolean satisfiability
Pseudorandom
Logic simulation
Suresh kumar Devanathan Suresh kumar Devanathan?action=edit&redlink=1

Advanced semantic analysis

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Map overview Semantic statistics

Nodes37

Edges36

Triples4

Avg. degree1.95

Density0.054054

Components1

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Important terminology Word statistics

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Important terminology

fault test atpg circuit model faults used sequential design algorithm signal single patterns stuck-at logic one pattern bridging combinational delay

Entity relationships Subject–Predicate–Object triples

Subject	Predicate	Object	Confidence	Src
partial scan	instance of	combined with low-overhead DFT techniques	0.80	text
have shown a certain degree of success in testing large designs	instance of	combined with low-overhead DFT techniques	0.80	text
boolean difference	instance of	many different ATPG methods have been developed to address combinational and sequential circuits.Early test generation algorithms	0.80	text
literal proposition were not practical to implement on a computer.The D Algorithm was the first practical test generation algorithm in terms of memory requirements	instance of	many different ATPG methods have been developed to address combinational and sequential circuits.Early test generation algorithms	0.80	text

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Algorithmic methods

Sequential ATPG

Basics

Overview

Key facts & relationships

Topics to explore

Overview

Basics

Sequential ATPG

Algorithmic methods

Advanced semantic analysis

Map overview Semantic statistics