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Device under test

A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks. This can include a test after repair to establish that the product is performing in accordance…

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Electronics testing

Semiconductor testing

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Map overview Semantic statistics

Device under test

Nodes13
Edges12
Triples7
Avg. degree1.85
Density0.153846
Components1

How this topic connects Entity context

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Device under test

Top relations

related to Semiconductor testing · 6
Device under test → ATE, In, Once, The, While, ZIF
is a · 1
Device under test → die on a wafer or the resulting packaged part

Important terminology Word statistics

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Important terminology

test equipment dut testing device part product automatic also using packaged electronics semiconductor wafer assembly cell way individual chips tester

Entity relationships Subject–Predicate–Object triples

SubjectPredicateObjectConfidenceSrc
Device under testis adie on a wafer or the resulting packaged part0.90text
Device under testrelated to Semiconductor testingIn0.60section
Device under testrelated to Semiconductor testingThe0.60section
Device under testrelated to Semiconductor testingWhile0.60section
Device under testrelated to Semiconductor testingATE0.60section
Device under testrelated to Semiconductor testingOnce0.60section
Device under testrelated to Semiconductor testingZIF0.60section

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    Min side: 3
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