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A single-event upset (SEU), also known as a single-event error (SEE), is a change of state caused by one single ionizing particle (e.g. ions, electrons, photons) striking a sensitive node in a live micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors. The state change is a result of the free charge created by…
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| Subject | Predicate | Object | Confidence | Src |
|---|---|---|---|---|
| Single-event upset | related to Further reading | May | 0.60 | section |
| Single-event upset | related to Further reading | Woods | 0.60 | section |
| Single-event upset | related to Further reading | IEEE Trans Electron Devices | 0.60 | section |
| Single-event upset | related to Further reading | ED-26 | 0.60 | section |
| Single-event upset | related to Further reading | Soft-error | 0.60 | section |
| Single-event upset | related to Further reading | JEDEC JESD89A | 0.60 | section |
| Single-event upset | related to Further reading | Ziegler | 0.60 | section |
| Single-event upset | related to Further reading | Lanford | 0.60 | section |
| Single-event upset | related to Further reading | Effect | 0.60 | section |
| Single-event upset | related to Further reading | Cosmic Rays | 0.60 | section |
| Single-event upset | related to Further reading | Computer Memories | 0.60 | section |
| Single-event upset | related to Further reading | Science | 0.60 | section |
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