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Rietveld refinement

Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions. The height, width and position of these reflections can be used to determine many aspects…

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Overview

Hugo RietveldCrystallineNeutronX-rayDiffraction of powder samples
21 related topics

Powder diffraction profiles: peak positions and shapes

Structure factorMultiplicity
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Preferred orientation

Texture
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Overview

Powder diffraction profiles: peak positions and shapes

Preferred orientation

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Rietveld refinement

Nodes28
Edges27
Triples43
Avg. degree1.93
Density0.071429
Components1

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Rietveld refinement

Top relations

related to Introduction · 14
Rietveld refinement → Despite, However, Hugo Rietveld, In, It, Other, Powder XRD, PXRD, Rietveld, The, The Rietveld, X-ray, XRD, XRD's
related to Least squares method · 11
Rietveld refinement → Chapter, Each, First, Further, Pecharsky, Rietveld, The, There, This, Thus, Zavalij's
related to Powder diffraction profiles: peak positions and shapes · 8
Rietveld refinement → Before, Bragg, Each, Rietveld, So, Some, Table, The
is a · 2
Rietveld refinement → non-linear least squares approach, technique described by Hugo Rietveld for use in the characterisation of crystalline materials

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Important terminology

displaystyle parameters peak powder diffraction function refinement rietveld used bragg shape background intensity data structure functions theta pattern method crystal

Entity relationships Subject–Predicate–Object triples

SubjectPredicateObjectConfidenceSrc
Rietveld refinementis atechnique described by Hugo Rietveld for use in the characterisation of crystalline materials0.90text
Rietveld refinementis anon-linear least squares approach0.90text
x-ray energy or neutron time-of-flightinstance ofThis terminology will be used here although the technique is equally applicable to alternative scales0.80text
crystallite sizeinstance ofand secondly the physical properties of the sample0.80text
and microstrain.A short asideinstance ofand secondly the physical properties of the sample0.80text
higher qualityinstance oftilting the detector forward such that the topmost edge of it is directly above the sample provides a number of benefits0.80text
better resolved radial distribution functions than in typical traditional geometriesinstance oftilting the detector forward such that the topmost edge of it is directly above the sample provides a number of benefits0.80text
improved dynamic rangeinstance oftilting the detector forward such that the topmost edge of it is directly above the sample provides a number of benefits0.80text
increased reciprocal space resolution per pixel for low angle scatteringinstance oftilting the detector forward such that the topmost edge of it is directly above the sample provides a number of benefits0.80text
access to higher reciprocal space values at lower energiesinstance oftilting the detector forward such that the topmost edge of it is directly above the sample provides a number of benefits0.80text
Rietveld refinementrelated to IntroductionThe0.60section
Rietveld refinementrelated to IntroductionX-ray0.60section

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