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Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state (when the circuit is not switching and inputs are held at static values). The current consumed in this state is commonly called Iddq for Idd (quiescent) and hence the name.
Measurement, Future of Iddq testing & Advantages and disadvantages
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iddq current testing test supply faults quiescent cmos many inputs leakage circuit power observability digital tests manufacturing measuring idd state
| Subject | Predicate | Object | Confidence | Src |
|---|---|---|---|---|
| Iddq testing | is a | method for testing CMOS integrated circuits for the presence of manufacturing faults | 0.90 | text |
| Iddq testing | related to Advantages and disadvantages | Iddq | 0.60 | section |
| Iddq testing | related to Advantages and disadvantages | It | 0.60 | section |
| Iddq testing | related to Advantages and disadvantages | The | 0.60 | section |
| Iddq testing | related to Advantages and disadvantages | Test | 0.60 | section |
| Iddq testing | related to Further reading | Rajsuman | 0.60 | section |
| Iddq testing | related to Further reading | Rochit | 0.60 | section |
| Iddq testing | related to Further reading | October | 0.60 | section |
| Iddq testing | related to Further reading | Iddq | 0.60 | section |
| Iddq testing | related to Further reading | CMOS VLSI | 0.60 | section |
| Iddq testing | related to Further reading | Artech House Publishers | 0.60 | section |
| Iddq testing | related to Further reading | ISBN | 0.60 | section |
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