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In electronics, a cross section, or microsection, is a prepared electronics sample that allows analysis at a plane that cuts through the sample. It is a destructive technique requiring that a portion of the sample be cut or ground away to expose the internal plane for analysis. They are commonly prepared for research, manufacturing quality assurance…
Preparation, Analysis techniques for cross sections & Solder joints
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cross analysis solder prepared sections grinding quality section sample samples plane commonly failure interest electronic components joints material used technique
| Subject | Predicate | Object | Confidence | Src |
|---|---|---|---|---|
| the amount of solder that has filled into a large | instance of | The features of interest to be analyzed in cross section can be nanometer-scale metal and dielectric layers in semiconductors up to macroscopic features | 0.80 | text |
| 0.125in | instance of | The features of interest to be analyzed in cross section can be nanometer-scale metal and dielectric layers in semiconductors up to macroscopic features | 0.80 | text |
| alumina might require a different technique than a soft material like gold or soft plastic.Mechanical grinding | instance of | Cross-sectioning hard materials | 0.80 | text |
| polishingMechanical grinding | instance of | Cross-sectioning hard materials | 0.80 | text |
| polishing is a common method of preparation to analyze features on the order of 1s to 10s of microns to macroscopic features | instance of | Cross-sectioning hard materials | 0.80 | text |
| epoxy to keep the sample intact during grinding | instance of | Samples may be prepared by encapsulation in a rigid material | 0.80 | text |
| with a vacuum step to fill in air gaps | instance of | Samples may be prepared by encapsulation in a rigid material | 0.80 | text |
| create a solid sample with no voids | instance of | Samples may be prepared by encapsulation in a rigid material | 0.80 | text |
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