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Scanning helium microscopy

The scanning helium microscope (SHeM) is a form of microscopy that uses low-energy (5–100 meV) neutral helium atoms to image the surface of a sample without any damage to the sample caused by the imaging process. Since helium is inert and neutral, it can be used to study delicate and insulating surfaces. Images are formed by rastering a sample underneath…

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Scanning helium microscopy

Nodes45
Edges44
Triples4
Avg. degree1.96
Density0.044444
Components1

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beam helium surface atoms sample pinhole wavelength scanning zone plate equation microscope small displaystyle electron used using atom energy high

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SubjectPredicateObjectConfidenceSrc
electroninstance ofgiving helium scattering an advantage over other techniques0.80text
x-ray scattering for surface studiesinstance ofgiving helium scattering an advantage over other techniques0.80text
diffractioninstance ofmore recently work has begun to see divergence from diffuse scattering due to effects0.80text
chemical contrast effectsinstance ofmore recently work has begun to see divergence from diffuse scattering due to effects0.80text

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